Accelerate Test Program Bring Up, Reduce
Test Cost and Minimize Post-Silicon Debug
Getting You Faster to a High-Quality
Test Program
Trusted by Hundreds of Semiconductor
Companies Worldwide Since 1999
Accelerate Test Program Bring Up, Reduce
Test Cost and Minimize Post-Silicon Debug
Getting You Faster to a High-Quality
Test Program
Trusted by Hundreds of Semiconductor
Companies Worldwide Since 1999
Learn How To Accelerate Your ATE Test Program Bring Up and Debug
TestInsight’s design-to-test tools are the industry standard for test vector translation, validation, optimization and visualization. They are used by hundreds of semiconductor companies, from the largest chipmakers to stealth-mode startups.
The proven fastest conversion tool on the market, translating STIL, WGL and e/VCD into V93K, T2000, J750, u/Flex, Eagle, NI, Cohu and more.
A Virtual ATE that enables early pre-silicon failure detection, making production test debug shorter and more predictable while improving quality.
A Mixed-Signal Virtual ATE that enables early pre-silicon failure detection, making production test debug shorter and more predictable while improving quality.
Compares test vectors of different EDA and ATE formats for improved quality and debug flow, tracking down the root cause of any difference.
Generates optimized test patterns at runtime with no need to simulate and translate them, supporting incremental test update to save ATE time.
An intuitive GUI packing a wealth of vector analysis and optimization tools―waver, tester rule check, vector edit, compression and parallelization.
The TestInsight tools support all popular Automatic Test Equipment and semiconductor IC tester platforms by Advantest, Teradyne, Cohu, NI and more, such as 93K / V93000, T2K / T2000, ATP, J750, J750ex, Flex, UltraFlex, Eagle, ets364, ets800, IG-XL and DiamondX. Use the table below to find the right tool for your specific project.
Test Program Creation
Test Program Validation
Reduce
Time to Market
Faster pattern conversion
with up to 200x faster translation
Faster test dev
leveraging advanced ATE features such
as Multiple Clock Domains, Xmodes etc.
Faster ATE execution
using incremental test update
Faster test dev
eliminating DUT-setup
simulation and translation
Less duplicated work
using a shared database
Faster ATE execution
using test vector optimization
Less post-si debug
using Tester Rule Checker
Faster test dev
using an intuitive GUI
Less post-si debug
using pre-si test program validation
Faster post-si debug
using EDA tools instead
of just ATE
Pre-si load board debug
reduces post-si load board issues
Less post-si debug
using pre-si validation of mixed-signal test programs
Faster post-si debug
using EDA tools instead
of just ATE
Faster debug
detecting mismatches between identical patterns of different formats
Reduce
Costs
Less ATE time
using incremental test update
Fewer man-hours
by eliminating pattern maintenance
and duplicated work using
a shared database
Greater ATE selection
thanks to an ATE-independent
database
Less ATE time
using test vector optimization
Fewer man-hours
by using an intuitive GUI
and programmable test
editing
Greater ATE selection
using test vector
manipulation
Fewer man-hours
thanks to faster post-si
debug using EDA tools
instead of just ATE
Fewer man-hours
thanks to faster post-si
debug using EDA tools
instead of just ATE
Fewer man-hours
thanks to faster debug,
detecting mismatches
between identical patterns
of different formats
Greater ATE selection
verifying that tests of
different systems are
identical
Improve
Quality
ATE readiness
using tester compliance
validation
Better ATE patterns
thanks to ultimate
conversion accuracy
Better ATE patterns
eliminating error-prone
duplicated work and
pattern maintenance
ATE readiness
using Tester Rule Checker
Better ATE patterns
thanks to an improved
workflow using an
intuitive GUI
ATE readiness
using closed-loop test
program validation
ATE readiness
using closed-loop test
program validation
Better ATE patterns
verifying that tests of
different formats are
identical
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